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Home Semiconductor manufacture Apparatus-and-methods-for-infrared-calorimetric-measurements

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 Apparatus and methods for infrared calorimetric measurements

Details
Inventors: Neilson, Andy C.; Sweeney, Michael R.; Orrell, III, James D.; Oster, Michael W.; Hopkins, John M.; Samson, Marc;
Assignee: FLIR Systems Boston, Inc. (North Billerica, MA)
Primary Examiner: Snay; Jeffrey R.
Assistant Examiner:
Attorney, Agent or Firm: Kolisch Hartwell, P.C.

Apparatus and methods for performing calorimetry. The apparatus include optical devices for detecting thermal processes and multiwell sample plates for supporting samples for use with such optical devices. The methods include measurement strategies and data processing techniques for reducing noise in measurements of thermal processes. The apparatus and methods may be particularly suitable for extracting thermal data from small differential measurements made using an infrared camera and for monitoring chemical and physiological processes.

DETAILED DESCRIPTION The invention provides apparatus and methods for performing calorimetry.
The apparatus include optical devices for detecting thermal processes and multiwell sample plates for supporting samples for use with such optical devices.
The methods include measurement strategies and data processing techniques for reducing noise in measurements of thermal processes.
The apparatus and methods may be particularly suitable for extracting thermal data from small differential measurements made using an infrared camera and for monitoring chemical and physiological processes.



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