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Semiconductor manufacture

Detection-of-alpha-radiation-in-a-beta-radiation-field

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Detection of alpha radiation in a beta radiation field

Details

Inventors: Mohagheghi, Amir H.; Reese, Robert P.;
Assignee: Sandia Corporation (Albuquerque, NM)
Primary Examiner: Hannaher; Constantine
Assistant Examiner: Israel; Andrew
Attorney, Agent or Firm: Klavetter; Elmer A.

An apparatus and method for detecting alpha particles in the presence of high activities of beta particles utilizing an alpha spectrometer. The apparatus of the present invention utilizes a magnetic field applied around the sample in an alpha spectrometer to deflect the beta particles from the sample prior to reaching the detector, thus permitting detection of low concentrations of alpha particles. In the method of the invention, the strength of magnetic field required to adequately deflect the beta particles and permit alpha particle detection is given by an algorithm that controls the field strength as a function of sample beta energy and the distance of the sample to the detector.

DETAILED DESCRIPTION According to the present invention, an apparatus for detecting alpha particles in the presence of beta particles is provided, comprising an alpha spectrometer, means for generating a magnetic field within the vacuum chamber of the alpha spectrometer; a magnet yoke to constrain the magnetic field; and means for controlling the strength of the generated magnetic field.
The means for generating a magnetic field is preferably a Helmholtz coil.
According to the present invention, a method for detecting alpha particles in the presence of beta particles is also provided, comprising of placing a sample in an alpha spectrometer; applying a magnetic field around the alpha spectrometer, said magnet field produced by Helmholtz coils surrounding the alpha spectrometer and constrained by an iron magnet yoke; and detecting alpha particles from the sample.
The applied magnetic field is preferably within the range of 500 Gauss to 8000 Gauss.
The magnetic field strength required can be determined by multiplying the value of the maximum beta energy of the sample in units of keV by 6.
75, adding 1380 and dividing the sum by the distance in centimeters of the sample to the alpha spectrometer detector.

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