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 Method of manufacturing a semiconductor device utilizing etch and refill to form isolation regions

Details
Inventors: Muramatsu, Akira;
Assignee: Hitachi, Ltd. (Tokyo, JP)
Primary Examiner: Rutledge; L. Dewayne
Assistant Examiner: Saba; W. G.
Attorney, Agent or Firm: Antonelli, Terry & Wands

A method of manufacturing a semiconductor device characterized in that after a fine groove has been formed in the surface of a semiconductor layer by dry etching, an insulating region is formed so as to fill up the fine groove.

DETAILED DESCRIPTION A first object of this invention is to provide a novel method of forming an isolation region as is free from the disadvantage described above.
A second object of this invention is to provide a method of manufacturing a semiconductor device as employs the novel method of forming an isolation region.



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