Semiconductor component with pressure contact |
| The present invention provides a semiconductor device of the above-mentioned type in such a way ... |
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Closure for semiconductor device and method of construction |
| OF THE INVENTION A semiconductor device constructed according to the invention is shown in FIG. 1 ... |
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Dynamic reference voltage generator |
| A reference voltage generator is provided for generating reference voltages for latch-type circuits ... |
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Portable television receiver of the panel type |
| Accordingly, an object of the present invention is to provide a panel type portable television ... |
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Compact, wideband antenna system |
| A compact, wideband antenna system is provided by a meander zigzag monopole antenna configured from ... |
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Antenna for radio apparatus |
| An object of the invention is to provide a compact antenna which can obtain a desired matching ... |
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Antenna for a radio communication apparatus |
| It is, therefore, an object of the present invention to provide an antenna for a radio ... |
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Retractable helical antenna |
| In view of the above, the invention hereby disclosed comprises a mechanism to facilitate the ... |
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Telescopic antenna for portable telephones |
| The object of the present invention is to provide a telescopic antenna for a portable telephone ... |
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Process enhancement using molybdenum plugs in fabricating integrated circuits
| Details |
Inventors: Rao, Raman K.;
Assignee: Micro Power Systems, Inc. (Santa Clara, CA)
Primary Examiner: Hearn; Brian E.
Assistant Examiner: Dang; Trung
Attorney, Agent or Firm: Woodward; Henry K.
A method of interconnecting circuit components in a semiconductor integrated circuit including component elements formed in the substrate and thin-film resistors and capacitors formed on a surface of the substrate, a molybdenum plug is utilized to facilitate stable, uniform low resistance contacts to circuit elements, molybdenum (moly) plugs are utilized as a barrier between interconnect metallization and the circuit components. A CLAD moly/aluminum metallization interconnect can be fabricated in a standard process in which the moly plugs are formed. The accuracy and stability of thin-film resistors is facilitated during wafer processing, laser trimming, temperature cycling, and assembly processing thereby providing repeatable matching by eliminating contact resistance as a process variable. |
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DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS The use of a moly plug in accordance with the invention allows aluminum to make contact through a thermally stable barrier with other interconnects, diffusions or gates as well as thin film resistors. The process permits the simultaneous formation of another level of interconnect using the moly as an interconnect and also as a barrier plug. Further, the moly plug process allows the use of diffusion as an interconnect by allowing the contact of moly as a strap. Thus, aluminum to moly to diffusion strap can be easily created. Additionally, two or more levels of interconnects can be contacted with diffusions using the moly as a barrier between the interconnect (aluminum, polysilicon, silicide poly or refractory metals) and the diffusion. By using the moly plug process as a strap between various interconnect levels, two dissimilar interconnects that might metallurgically interact with each other can be strapped and electrically connected to each other using the moly plug process. Referring now to the drawing, FIG. 1 is a section view of a portion of an integrated circuit illustrating the general process scheme for forming multi-level interconnects and contacts between various circuit elements. In this embodiment a silicon substrate 10 has a diffused region 12 in a surface thereof. Formed on the surface is a silicon oxide layer 14 and silicon nitride layers 16,18. A thick oxide layer 20 is formed over the nitride layers, and formed on the oxide layer 20 is a thin film resistor 22 and a plurality of aluminum contacts 24, 26, 28, and 30. Nitride and oxide layers 32 and 34, respectively, are formed on the top of the structure. In section one of the structure a moly one layer 36 and a moly two layer 38 are separated by thin nitride layer to function as a capacitor. In section two of the circuit, the moly one and moly two layers form a plug separating the aluminum contact 26 from the diffused region 12. In section three of the circuit, the moly one layer separates the contacts 28 and 30 from opposite ends of the thin film resistor 22
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