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Details
Inventors: Nagatsuma, Kazuyuki; Matsumura, Hiroyoshi; Katsuyama, Toshio; Suganuma, Tsuneo;
Assignee: Hitachi, Ltd. (Tokyo, JP); Hitachi Cable, Ltd. (Tokyo, JP)
Primary Examiner:
Assistant Examiner:
Attorney, Agent or Firm:

An electric-field measuring apparatus utilizing electrooptic effect for measuring the intensity of an electric DC field includes a material exhibiting both electrooptic effect and photoelectric effect or both a material exhibiting the electrooptic effect and a material exhibiting the photoelectric effect which material or materials are irradiated with a continuous light ray of a wavelength capable of inducing the electrooptic effect and an intermittently interrupted light ray of a wavelength capable of inducing the photoelectric effect.

DETAILED DESCRIPTION We claim: 1.
An optical electric-field measuring apparatus, comprising: light source means; field sensing means for varying an intensity of light emitted by said light source means correspondingly in dependence on an intensity of an electric field; measuring means for measuring the intensity of light delivered from said field sensing means; and light guide means for optically coupling said light source means; said field sensing means and said measuring means to one another; wherein said field sensing means exhibits both an electrooptic effect and a photoelectric effect, while said light source means produces at least light of a wavelength capable of inducing said electrooptic effect and light of a wavelength capable of inducing said photoelectric effect.
2.
An optical electric-field measuring apparatus according to claim 1, wherein said light of the wavelength capable of inducing said photoelectric effect is intermittently interrupted light.
3.
An optical electric-field measuring apparatus according to claim 2, wherein said field sensing means includes a material exhibiting both the electrooptic effect and the photoelectric effect.
4.
An optical electric-field measuring apparatus according to claim 3, wherein said material is composed of a single crystal of CdS.
5.
An optical electric-field measuring apparatus according to claim 2, wherein said field sensing means includes both a material exhibiting the electrooptic effect and a material exhibiting the photoelectric effect.
6.
An optical electric-field measuring apparatus according to claim 2, wherein said field sensing means includes a material exhibiting the electrooptic effect and a photoelectric element electrically inserted between end faces of said material extending perpendicularly to the direction in which the electric field is applied to said material.
7.
An optical electric-field measuring apparatus according to claim 1, wherein said field sensing means includes a material exhibiting both the electrooptic effect and the photoelectric effect


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